Application: Film Thickness Calibration Equipment: Single Wavelength Ellipsometer (SWE), Spectroscopic Ellipsometer (SE), Reflectometer Film: Silicon Nitride Traceability: NIST Product Range: 200 Å to 2,000 Å   Wafer Diameter Film Thickness (Å) 100 mm 125 mm 150 mm 200 mm 200 NFTS4-200 NFTS5-200 NFTS6-200 NFTS8-200 900 NFTS4-900 NFTS5-900 NFTS6-900 NFTS8-900 1,200 NFTS4-1200 NFTS5-1200 NFTS6-1200 NFTS8-1200 2,000 NFTS4-2000 NFTS5-2000 NFTS6-2000 NFTS8-2000