Available Models If you would like to request a quote, please indicate the number of standards you'd like for each model. Click on the button to add these items to your quote basket. Model No. Featured Material Nominal Height Pitch Design Description Part Number Quantity STR3-180P Silicon dioxide coated with a uniform layer of platinum 18 nm 3 µm pitch grid 8 mm x 8 mm silicon die with 1.2 mm x 1.2 mm measurement area 407_VLSI STR3-440P Silicon dioxide coated with a uniform layer of platinum 44 nm 3 µm pitch grid 8 mm x 8 mm silicon die with 1.2 mm x 1.2 mm measurement area 408_VLSI STR3-1000P Silicon dioxide coated with a uniform layer of platinum 100 nm 3 µm pitch grid 8 mm x 8 mm silicon die with 1.2 mm x 1.2 mm measurement area 409_VLSI STR3-1800P Silicon dioxide coated with a uniform layer of platinum 180 nm 3 µm pitch grid 8 mm x 8 mm silicon die with 1.2 mm x 1.2 mm measurement area 410_VLSI STR10-180P Silicon dioxide coated with a uniform layer of platinum 18 nm 10 µm pitch grid 8 mm x 8 mm silicon die with 4 mm x 4 mm measuremement area 400_VLSI STR10-440P Silicon dioxide coated with a uniform layer of platinum 44 nm 10 µm pitch grid 8 mm x 8 mm silicon die with 4 mm x 4 mm measuremement area 402_VLSI STR10-1000S Silicon dioxide 100 nm 10 µm pitch grid 8 mm x 8 mm silicon die with 4 mm x 4 mm measurement area 399_VLSI STR10-1800P Silicon dioxide coated with a uniform layer of platinum 180 nm 10 µm pitch grid 8 mm x 8 mm silicon die with 4 mm x 4 mm measurement area

Model Number Information for Surface Topography References STS is an acronym for Surface Topography Standard. Each standard contains 3 pitch grids patterned into a single film thickness. The model number identifies the nominal feature height. The product is shipped as a set: one standard and one reference. STR is an acronym for Surface Topography Reference. References can be ordered separately.