Application: Film Thickness Calibration Equipment: Single Wavelength Ellipsometer (SWE), Spectroscopic Ellipsometer (SE) and Reflectometer Film: Silicon Dioxide Traceability: SI units through NIST Product Range: 20 Å to 10,100 Å   Wafer Diameter Film Thickness (Å) 100 mm 125 mm 150 mm 200 mm 300 mm 20   FTS8-20 FTS12-20 45 FTS4-45 FTS5-45 FTS6-45 FTS8-45 FTS12-45 75 FTS4-75 FTS5-75 FTS6-75 FTS8-75 FTS12-75 120 FTS4-120 FTS5-120 FTS6-120 FTS8-120 FTS12-120 250 FTS4-250 FTS5-250 FTS6-250 FTS8-250 FTS12-250 500 FTS4-500 FTS5-500 FTS6-500 FTS8-500 FTS12-500 1000 FTS4-1000 FTS5-1000 FTS6-1000 FTS8-1000 FTS12-1000 2,000 FTS4-2000 FTS5-2000 FTS6-2000 FTS8-2000 FTS12-2000 4,000 FTS4-4000 FTS5-4000 FTS6-4000 FTS8-4000 FTS12-4000 6,750 FTS4-6750 FTS5-6750 FTS6-6750 FTS8-6750 FTS12-6750 10,100 FTS4-10100 FTS5-10100 FTS6-10100 FTS8-10100 FTS12-10100